203 search results - page 9 / 41 » Test Generation and Fault Localization for Quantum Circuits |
VLSID
1995
IEEE
13 years 11 months ago
1995
IEEE
TODAES
1998
13 years 7 months ago
1998
GLVLSI
2002
IEEE
14 years 12 days ago
2002
IEEE
This paper develops new techniques for detecting both stuck-open faults and resistive open faults, which result in increased delays along some paths. The improved detection of CMO...
ICCD
2006
IEEE
14 years 1 months ago
2006
IEEE
—This paper introduces a new class of sequential circuits called acyclically testable sequential circuits which is wider than the class of acyclic sequential circuits but whose t...
ICCAD
2000
IEEE
13 years 12 months ago
2000
IEEE
This paper presents new test generation techniques for improving the average-case performance of the iterative logic array based deterministic sequential circuit test generation a...