112 search results - page 12 / 23 » Test generation in VLSI circuits for crosstalk noise |
VLSID
2002
IEEE
14 years 8 months ago
2002
IEEE
We give an algorithm to model any given multiple stuck-at fault as a single stuck-at fault. The procedure requires insertion of at most ? ? ? modeling gates, when the multiplicity...
ASPDAC
2005
ACM
13 years 9 months ago
2005
ACM
Recent research results have shown that the traditional structural testing for delay and crosstalk faults may result in over-testing due to the non-trivial number of such faults t...
VLSID
1997
IEEE
13 years 12 months ago
1997
IEEE
Cascode CMOS op-amps use a large number of external bias voltages. This results in numerous drawbacks, namely, an area and power overhead, susceptiblity of the bias lines to noise...
VTS
2003
IEEE
14 years 27 days ago
2003
IEEE
Irreversible computation necessarily results in energy dissipation due to information loss. While small in comparison to the power consumption of today’s VLSI circuits, if curre...
GLVLSI
2009
IEEE
13 years 11 months ago
2009
IEEE
1 Soft errors caused by cosmic particles and radiation emitted by the packaging are an important problem in contemporary microprocessors. Parity bits are used to detect single bit ...