1610 search results - page 14 / 322 » Testing Patterns |
ATS
2010
IEEE
13 years 6 months ago
2010
IEEE
Systems with many integrated circuits (ICs), often of the same type, are increasingly common to meet the constant performance demand. However, systems in recent semiconductor techn...
ICCAD
2002
IEEE
14 years 6 months ago
2002
IEEE
This work presents several new techniques for enhancing the performance of deterministic test pattern generation for VLSI circuits. The techniques introduced are called dynamic de...
DAC
2007
ACM
14 years 11 months ago
2007
ACM
Due to shrinking technology, increasing functional frequency and density, and reduced noise margins with supply voltage scaling, the sensitivity of designs to supply voltage noise...
VLSID
2009
IEEE
14 years 10 months ago
2009
IEEE
We present the automatic test pattern generator TIGUAN based on a thread-parallel SAT solver. Due to a tight integration of the SAT engine into the ATPG algorithm and a carefully ...
DATE
2008
IEEE
14 years 4 months ago
2008
IEEE
N-detect test has been shown to have a higher likelihood for detecting defects. However, traditional definitions of Ndetect test do not necessarily exploit the localized characte...