With the advent of portable and high density microelectronic devices, the power dissipation of VLSI circuits is becoming a critical concern. In this paper, we propose a post
Patrick Girard, Christian Landrault, Serge Pravoss...
We describe a method for designing fault tolerant circuits based on an extension of a Concurrent Error Detection (CED) technique. The proposed extension combines parity check code...
A low overhead DFT technique, called clock-grouping, for delay testing of sequential synchronous circuits is presented. The proposed technique increases robust path delay fault co...
Multi Expression Programming (MEP) is a Genetic Programming (GP) variant that uses linear chromosomes for solution encoding. A unique MEP feature is its ability of encoding multipl...
- In this paper, we present an algorithm for gate sizing with controlled displacement to improve the overall circuit timing. We use a path-based delay model to capture the timing c...