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» Variation-tolerant circuits: circuit solutions and technique...
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ISLPED
1997
ACM
94views Hardware» more  ISLPED 1997»
13 years 11 months ago
A gate resizing technique for high reduction in power consumption
With the advent of portable and high density microelectronic devices, the power dissipation of VLSI circuits is becoming a critical concern. In this paper, we propose a post
Patrick Girard, Christian Landrault, Serge Pravoss...
DFT
2003
IEEE
117views VLSI» more  DFT 2003»
14 years 19 days ago
Fault Tolerant Design of Combinational and Sequential Logic Based on a Parity Check Code
We describe a method for designing fault tolerant circuits based on an extension of a Concurrent Error Detection (CED) technique. The proposed extension combines parity check code...
Sobeeh Almukhaizim, Yiorgos Makris
DAC
1994
ACM
13 years 11 months ago
Clock Grouping: A Low Cost DFT Methodology for Delay Testing
A low overhead DFT technique, called clock-grouping, for delay testing of sequential synchronous circuits is presented. The proposed technique increases robust path delay fault co...
Wen-Chang Fang, Sandeep K. Gupta
EH
2004
IEEE
107views Hardware» more  EH 2004»
13 years 11 months ago
Evolving Digital Circuits using Multi Expression Programming
Multi Expression Programming (MEP) is a Genetic Programming (GP) variant that uses linear chromosomes for solution encoding. A unique MEP feature is its ability of encoding multipl...
Mihai Oltean, Crina Grosan
ISPD
1999
ACM
94views Hardware» more  ISPD 1999»
13 years 11 months ago
Gate sizing with controlled displacement
- In this paper, we present an algorithm for gate sizing with controlled displacement to improve the overall circuit timing. We use a path-based delay model to capture the timing c...
Wei Chen, Cheng-Ta Hsieh, Massoud Pedram