1093 search results - page 108 / 219 » Verifying VLSI Circuits |
VLSID
2004
IEEE
14 years 10 months ago
2004
IEEE
We consider the problem of minimizing the delay in signal transmission over point-to-point connections across multiple metal layers in a VLSI circuit. We present an exact solution...
VLSID
2002
IEEE
14 years 10 months ago
2002
IEEE
| This paper reports the design of a Test Pattern Generator (TPG) for VLSI circuits. The onchip TPG is so designed that it generates test patterns while avoiding generation of a gi...
ICCAD
2001
IEEE
14 years 7 months ago
2001
IEEE
— Modern sub-micron VLSI designs include huge power grids that are required to distribute large amounts of current, at increasingly lower voltages. The resulting voltage drop on ...
GLVLSI
2009
IEEE
14 years 4 months ago
2009
IEEE
Based on the insertion of internal and external redundant wires into L-type and U-type wires, an efficient two-phase reliability-driven insertion algorithm is proposed to insert r...
GLVLSI
2008
IEEE
14 years 4 months ago
2008
IEEE
With the scaling down of the CMOS technologies, Negative Bias Temperature Instability (NBTI) has become a major concern due to its impact on PMOS transistor aging process and the ...