VLSID
2002
IEEE
14 years 12 months ago
2002
IEEE
We propose the redundancy identification of wire replacement faults. The solutions rely on the satisfiability (SAT) formulation of redundancy identification, augmented with the me...
VLSID
2002
IEEE
14 years 12 months ago
2002
IEEE
We describe a built-in test pattern generation method for scan circuits. The method is based on partitioning and storage of test sets. Under this method, a precomputed test set is...
VLSID
2002
IEEE
14 years 12 months ago
2002
IEEE
We present a methodology and algorithms for automatic refinement from a given design specification to an architecture model based on decisions in architecture exploration. An arch...
VLSID
2002
IEEE
14 years 12 months ago
2002
IEEE
Choosing the right methodology is a significant step towards successful VLSI designs. Traditional methodologies and tools are no longer adequate to handle large and complex design...
VLSID
2002
IEEE
14 years 12 months ago
2002
IEEE
Embedded DRAM (eDRAM) power-energy estimation is presented for system-on-a-chip (SOC) applications. The main feature is the signal swing based analytic (SSBA) model, which improve...
VLSID
2002
IEEE
14 years 12 months ago
2002
IEEE
With the projected significant growth in mobile internet and multimedia services, there is a strong demand for nextgeneration appliances capable of wireless image communication. O...
VLSID
2002
IEEE
14 years 12 months ago
2002
IEEE
This paper presents the applicability of a cosimulation methodology based on an object-oriented simulation environment, to multi-domain and multi-language systems design. This met...
VLSID
2002
IEEE
14 years 12 months ago
2002
IEEE
This paper presents a new method to compute the probability distribution of the delay of a combinational circuit and uses it obtain an estimate of the yield of the process that ma...
VLSID
2002
IEEE
14 years 12 months ago
2002
IEEE
As a basic cell of arithmetic circuits, a one-bit full adder and a counter are usually used. Minimizing power consumption of these components is a key issue for low-power circuit ...
VLSID
2002
IEEE
14 years 12 months ago
2002
IEEE
Directed test program-based verification or formal verification methods are usually quite ineffective on large cachecoherent, non-uniform memory access (CC-NUMA) multiprocessors b...