Hot-carrier eects and electromigration are the two important failure mechanisms that signicantly impact the long-term reliability of high-density VLSI ICs. In this paper, we prese...
: Electromigration induced degradation in integrated circuits has been accelerated by continuous scaling of device dimensions. We present a methodology for synthesizing high-reliab...
This paper proposes a state encoding method for asynchronous circuits based on the theory of regions. A region in a Transition System is a set of states that "behave uniforml...
Jordi Cortadella, Michael Kishinevsky, Alex Kondra...
In this paper, we study the problem of decomposing gates in fanin-unbounded or K-bounded networks such that the K-input LUT mapping solutions computed by a depthoptimal mapper hav...
In this paper, we present the rst chip-level electrothermal simulator, iCET. For a given chip layout, packaging material, user-specied input signal patterns, and thermal boundar...
1 In this paper, we propose a hybrid approach for estimating the switching activities of the internal nodes in logic circuits. The new approach combines the advantages of the simul...
David Ihsin Cheng, Kwang-Ting Cheng, Deborah C. Wa...
In this paper, we describe a technique for power reduction in sequential circuits. Existing signals in the circuit are used to selectively disable some of the registers so that a ...
Approximation has been shown to be an eective method for reducing the time and space costs of solving various oorplan area minimization problems. In this paper, we present several...
: While delay modeling of gates with a single switching input has received considerable attention, the case of multiple inputs switching in close temporal proximity is just beginni...