DATE
2005
IEEE
14 years 5 months ago
2005
IEEE
— With increasing process fluctuations in nano-scale technology, testing for delay faults is becoming essential in manufacturing test to complement stuck-at-fault testing. Desig...
DATE
2005
IEEE
14 years 5 months ago
2005
IEEE
The purpose of this paper is to formally specify a flow devoted to the design of Differential Power Analysis (DPA) resistant QDI asynchronous circuits. The paper first proposes a ...
DATE
2005
IEEE
14 years 5 months ago
2005
IEEE
We present a hybrid BIST approach that extracts the most frequently occurring sequences from deterministic test patterns; these extracted sequences are stored on-chip. We use clus...
DATE
2005
IEEE
14 years 5 months ago
2005
IEEE
Supply voltage scaling and adaptive body-biasing are important techniques that help to reduce the energy dissipation of embedded systems. This is achieved by dynamically adjusting...
DATE
2005
IEEE
14 years 5 months ago
2005
IEEE
The increasing complexity and the short life cycles of embedded systems are pushing the current system-onchip designs towards a rapid increasing on the number of programmable proc...
DATE
2005
IEEE
14 years 5 months ago
2005
IEEE
We discuss the problem of Concurrent Error Detection (CED) in a popular class of asynchronous controllers, namely Burst-Mode machines. We first outline the particularities of the...
DATE
2005
IEEE
14 years 5 months ago
2005
IEEE
In this paper, we present an experimental integrated platform for the research, development and evaluation of new VLSI back-end algorithms and design flows. Interconnect scaling ...
DATE
2005
IEEE
14 years 5 months ago
2005
IEEE
Instruction Level Parallelism (ILP) extraction for multicluster VLIW processors is a very hard task. In this paper, we propose a retargetable architecture that can exploit ILP and...
DATE
2005
IEEE
14 years 5 months ago
2005
IEEE
DATE
2005
IEEE
14 years 5 months ago
2005
IEEE
