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DATE
2005
IEEE
160views Hardware» more  DATE 2005»
14 years 5 months ago
SOC Testing Methodology and Practice
Abstract—On a commercial digital still camera (DSC) controller chip we practice a novel SOC test integration platform, solving real problems in test scheduling, test IO reduction...
Cheng-Wen Wu
DATE
2005
IEEE
152views Hardware» more  DATE 2005»
14 years 5 months ago
Design of Fault-Tolerant and Dynamically-Reconfigurable Microfluidic Biochips
Technology Roadmap for Semiconductors (ITRS) clearly identifies the integration of electrochemical and electrobiological techniques as one of the system-level design challenges tha...
Fei Su, Krishnendu Chakrabarty
DATE
2005
IEEE
96views Hardware» more  DATE 2005»
14 years 5 months ago
eMICAM a New Generation of Active DNA Chip with in Situ Electrochemical Detection
Most of the DNA chips available on the market are based on external or internal optical detection (fluorescence or chemiluminescence) and need a bulky chip reader (optics, laser, ...
Raymond Campagnolo
DATE
2005
IEEE
97views Hardware» more  DATE 2005»
14 years 5 months ago
Synchronization Processor Synthesis for Latency Insensitive Systems
In this paper we present our contribution in terms of synchronization processor for a SoC design methodology based on the theory of the latency insensitive systems (LIS) of Carlon...
Pierre Bomel, Eric Martin, Emmanuel Boutillon
DATE
2005
IEEE
121views Hardware» more  DATE 2005»
14 years 5 months ago
Joint Power Management of Memory and Disk
This paper presents a scheme to combine memory and power management for achieving better energy reduction. Our method periodically adjusts the size of physical memory and the time...
Le Cai, Yung-Hsiang Lu
DATE
2005
IEEE
96views Hardware» more  DATE 2005»
14 years 5 months ago
Reliable System Specification for Self-Checking Data-Paths
Cristiana Bolchini, Fabio Salice, Donatella Sciuto...
DATE
2005
IEEE
102views Hardware» more  DATE 2005»
14 years 5 months ago
New Schemes for Self-Testing RAM
This paper gives an overview of a new technique, named pseudo-ring testing (PRT). PRT can be applied for testing wide type of random access memories (RAM): bitor word-oriented and...
Ghenadie Bodean, D. Bodean, A. Labunetz
DATE
2005
IEEE
122views Hardware» more  DATE 2005»
14 years 5 months ago
Direct Conversion Pulsed UWB Transceiver Architecture
Ultra-wideband (UWB) communication is an emerging wireless technology that promises high data rates over short distances and precise locationing. The large available bandwidth and...
Raúl Blázquez, Fred S. Lee, David D....
DATE
2005
IEEE
97views Hardware» more  DATE 2005»
14 years 5 months ago
Specification Test Compaction for Analog Circuits and MEMS
Sounil Biswas, Peng Li, R. D. (Shawn) Blanton, Lar...
DATE
2005
IEEE
109views Hardware» more  DATE 2005»
14 years 5 months ago
ISEGEN: Generation of High-Quality Instruction Set Extensions by Iterative Improvement
Customization of processor architectures through Instruction Set Extensions (ISEs) is an effective way to meet the growing performance demands of embedded applications. A high-qua...
Partha Biswas, Sudarshan Banerjee, Nikil D. Dutt, ...