DATE
2006
IEEE
14 years 5 months ago
2006
IEEE
Customizing the bypasses in an embedded processor uncovers valuable trade-offs between the power, performance and the cost of the processor. Meaningful exploration of bypasses re...
DATE
2006
IEEE
14 years 5 months ago
2006
IEEE
We present a dynamic bit-width adaptation scheme in DCT applications for efficient trade-off between image quality and computation energy. Based on sensitivity differences of 64 ...
DATE
2006
IEEE
14 years 5 months ago
2006
IEEE
The power density inside high performance systems continues to rise with every process technology generation, thereby increasing the operating temperature and creating “hot spot...
DATE
2006
IEEE
14 years 5 months ago
2006
IEEE
Network-on-Chip (NoC)-based communication represents a promising solution to complex on-chip communication problems. Due to their regular structure, mesh-like NoC architectures ha...
DATE
2006
IEEE
14 years 5 months ago
2006
IEEE
This paper addresses an XML-based design environment, which provides a powerful basis for the manipulation of hardware design descriptions. The contribution of the paper is a flex...
DATE
2006
IEEE
14 years 5 months ago
2006
IEEE
This paper proposes a novel HW/SW co-simulation approach that minimizes the impact on software designers. We propose a SystemC-based system that enables the software team to test ...
DATE
2006
IEEE
14 years 5 months ago
2006
IEEE
We report the first fully integrated single photon avalanche diode array fabricated in 0.35µm CMOS technology. At 25µm, the pixel pitch achieved by this design is the smallest e...
DATE
2006
IEEE
14 years 5 months ago
2006
IEEE
As devices are scaled to the nanoscale regime, it is clear that future nanodevices will be plagued by higher soft error rates and reduced noise margins. Traditional implementation...
DATE
2006
IEEE
14 years 5 months ago
2006
IEEE
Defect density and defect size distributions (DDSDs) are key parameters used in IC yield loss predictions. Traditionally, memories and specialized test structures have been used t...
DATE
2006
IEEE
14 years 5 months ago
2006
IEEE
In this work a method to improve the loopback test used in RF analog circuits is described. The approach is targeted to the SoC environment, being able to reuse system resources i...