ICCAD
2006
IEEE
14 years 8 months ago
2006
IEEE
In order to handle device matching in analog circuits, some pairs of modules are required to be placed symmetrically. This paper addresses this device-level placement problem for ...
ICCAD
2006
IEEE
14 years 8 months ago
2006
IEEE
Defect tolerance is a major issue in nano computing. In this paper, an application-independent defect tolerant scheme for reconfigurable crossbar nano-architectures is presented....
ICCAD
2006
IEEE
14 years 8 months ago
2006
IEEE
The paper explores several ways to improve the speed and capacity of combinational equivalence checking based on Boolean satisfiability (SAT). State-of-the-art methods use simulat...
ICCAD
2006
IEEE
14 years 8 months ago
2006
IEEE
— For 65nm and below devices, even after optical proximity correction (OPC), the gate may still be non-rectangular. There are several limited works on the device and circuit char...
ICCAD
2006
IEEE
14 years 8 months ago
2006
IEEE
— Methods for assembling crossbars from nanowires (NWs) have been designed and implemented. Methods for controlling individual NWs within a crossbar have also been proposed, but ...
ICCAD
2006
IEEE
14 years 8 months ago
2006
IEEE
With the continued scaling of CMOS technologies and reduced design margins, the reliability concerns induced by transient faults have become prominent. Moreover, the popular energ...
ICCAD
2006
IEEE
14 years 8 months ago
2006
IEEE
- Redundant via insertion and line end extension employed in the post-routing stage are two well known and highly recommended techniques to reduce yield loss due to via failure. Ho...
ICCAD
2006
IEEE
14 years 8 months ago
2006
IEEE
In a synchronous finite state machine (FSM), huge current peaks are often observed at the moment of state transition. Previous low power state encoding algorithms focus on the red...
ICCAD
2006
IEEE
14 years 8 months ago
2006
IEEE
Most existing RCL−1 circuit reductions stamp inverse inductance L−1 elements by a second-order nodal analysis (NA). The NA formulation uses nodal voltage variables and describ...
ICCAD
2006
IEEE
14 years 8 months ago
2006
IEEE
As wireless LAN devices become more prevalent in the consumer electronics market, there is an ever increasing pressure to reduce their overall cost. The test cost of such devices ...