ICCAD
2006
IEEE
14 years 8 months ago
2006
IEEE
We describe a transition fault model, which is easy to simulate under test sequences that are applied at-speed, and provides a target for the generation of at-speed test sequences...
ICCAD
2006
IEEE
14 years 8 months ago
2006
IEEE
In this work we propose a methodology to self-consistently solve leakage power with temperature to predict thermal runaway. We target 28nm FinFET based circuits as they are more p...
ICCAD
2006
IEEE
14 years 8 months ago
2006
IEEE
With shrinking feature size and growing integration density in the Deep Sub-Micron technologies, the global buses are fast becoming the “weakest-links” in VLSI design. They ha...
ICCAD
2006
IEEE
14 years 8 months ago
2006
IEEE
Statistical Static Timing Analysis has received wide attention recently and emerged as a viable technique for manufacturability analysis. To be useful, however, it is important th...
ICCAD
2006
IEEE
14 years 8 months ago
2006
IEEE
ICCAD
2006
IEEE
14 years 8 months ago
2006
IEEE
ICCAD
2006
IEEE
14 years 8 months ago
2006
IEEE
We present global routing optimization methods which are not based on rip-up and re-route framework. In particular, the routing optimization is based on trunk decomposition [13] o...
ICCAD
2006
IEEE
14 years 8 months ago
2006
IEEE
Increasing power densities in Field Programmable Gate Arrays (FPGAs) have made them susceptible to thermal problems. The advent of platform FPGAs has further exacerbated the probl...
ICCAD
2006
IEEE
14 years 8 months ago
2006
IEEE
