Abstract—Manufacturing process variations lead to circuit timing variability and a corresponding timing yield loss. Traditional corner analysis consists of checking all process c...
Capacitive interconnections are very promising structures for high-speed and low-power signaling in 3D packages. Since the performance of AC links, in terms of Band-Width and Bit-...
Alberto Fazzi, L. Magagni, Mario de Dominicis, Pao...
The use of CMOS nanometer technologies at 65 nm and below will pose serious challenges on the design of mixed-signal integrated systems in the very near future. Rising design comp...
Process variations cause different behavior of timingdependent effects across different chips. In this work, we analyze one example of timing-dependent effects, crosscoupling ...
We present a dynamic voltage scaling (DVS) technique that minimizes system-wide energy consumption for both periodic and sporadic tasks. It is known that a system consists of proc...
We present a gridless method for solving the interior problem for a set of conductors in an homogeneous dielectric, at sufficiently high frequencies, valid for conductor lengths ...
Efficient communication modeling is a critical task in SoC design and exploration. In particular, fast and accurate communication is needed to predict the performance of a system....
This paper examines how circuits and systems made from molecular QCA devices might function. Our design constraints are “chemically reasonable” in that we consider the charact...
Michael T. Niemier, Michael Crocker, Xiaobo Sharon...
Parametric yield loss due to variability can be effectively reduced by both design-time optimization strategies and by adjusting circuit parameters to the realizations of variable...
Murari Mani, Ashish Kumar Singh, Michael Orshansky