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ICCAD
2006
IEEE
129views Hardware» more  ICCAD 2006»
14 years 8 months ago
Energy budgeting for battery-powered sensors with a known task schedule
Battery-powered wireless sensors are severely constrained by the amount of the available energy. A method for computing the energy budget per sensing task can be a valuable design...
Daler N. Rakhmatov
ICCAD
2006
IEEE
157views Hardware» more  ICCAD 2006»
14 years 8 months ago
From single core to multi-core: preparing for a new exponential
In the past, processor design trends were dominated by increasingly complex feature sets, higher clock speeds, growing thermal envelopes and increasing power dissipation. Recently...
Jeff Parkhurst, John A. Darringer, Bill Grundmann
ICCAD
2006
IEEE
95views Hardware» more  ICCAD 2006»
14 years 8 months ago
Robust estimation of parametric yield under limited descriptions of uncertainty
Reliable prediction of parametric yield for a specific design is difficult; a significant reason is the reliance of the yield estimation methods on the hard-to-measure distributio...
Wei-Shen Wang, Michael Orshansky
ICCAD
2006
IEEE
101views Hardware» more  ICCAD 2006»
14 years 8 months ago
Guaranteeing performance yield in high-level synthesis
Meeting timing constraint is one of the most important issues for modern design automation tools. This situation is exacerbated with the existence of process variation. Current hi...
Wei-Lun Hung, Xiaoxia Wu, Yuan Xie
ICCAD
2006
IEEE
103views Hardware» more  ICCAD 2006»
14 years 8 months ago
A statistical framework for post-silicon tuning through body bias clustering
Adaptive body biasing (ABB) is a powerful technique that allows post-silicon tuning of individual manufactured dies such that each die optimally meets the delay and power constrai...
Sarvesh H. Kulkarni, Dennis Sylvester, David Blaau...
ICCAD
2006
IEEE
146views Hardware» more  ICCAD 2006»
14 years 8 months ago
An analytical model for negative bias temperature instability
— Negative Bias Temperature Instability (NBTI) in PMOS transistors has become a significant reliability concern in present day digital circuit design. With continued scaling, th...
Sanjay V. Kumar, Chris H. Kim, Sachin S. Sapatneka...
ICCAD
2006
IEEE
99views Hardware» more  ICCAD 2006»
14 years 8 months ago
Variability and yield improvement: rules, models, and characterization
Yield and variability are becoming detractors for successful design in sub-90-nm process technologies. We consider the fundamental lithography and process issues that are driving ...
Kenneth L. Shepard, Daniel N. Maynard
ICCAD
2006
IEEE
123views Hardware» more  ICCAD 2006»
14 years 8 months ago
A network-flow approach to timing-driven incremental placement for ASICs
We present a novel incremental placement methodology called FlowPlace for significantly reducing critical path delays of placed standard-cell circuits. FlowPlace includes: a) a t...
Shantanu Dutt, Huan Ren, Fenghua Yuan, Vishal Suth...
ICCAD
2006
IEEE
125views Hardware» more  ICCAD 2006»
14 years 8 months ago
Leveraging protocol knowledge in slack matching
Stalls, due to mis-matches in communication rates, are a major performance obstacle in pipelined circuits. If the rate of data production is faster than the rate of consumption, t...
Girish Venkataramani, Seth Copen Goldstein
ICCAD
2006
IEEE
149views Hardware» more  ICCAD 2006»
14 years 8 months ago
Thermal sensor allocation and placement for reconfigurable systems
Temperature monitoring using thermal sensors is an essential tool for evaluating the thermal behavior and sustaining the reliable operation in high-performance and high-power syst...
Rajarshi Mukherjee, Somsubhra Mondal, Seda Ogrenci...