A deterministic BIST scheme for circuits with multiple scan paths is presented. A procedure is described for synthesizing a pattern generator which stimulates all scan chains simu...
This work proposes an approach to generate weighted random patterns which can maximally excite a circuit during its burn-in testing. The approach is based on a probability model a...
ABSTRACT - A multiple pass A/D conversion technique is proposed for mixed-signal test applications. Only a single on-chip comparator and sample-and-hold circuit is required to digi...
This paper addresses the problem of efficiently and accurately generating two-vector tests for crosstalk induced effects, such as pulses, signal speedup and slowdown, in digital c...
We investigate defects in CMOS domino gates and derive the test conditions for them. Very-Low-Voltage Testing can improve the defect coverage, which we define as the maximum detec...