ITC
1998
IEEE
14 years 23 days ago
1998
IEEE
ITC
1998
IEEE
14 years 23 days ago
1998
IEEE
Automated fault diagnosis based on the stuckat fault model is not always effective. This paper presents practical experiences in applying a bridging fault based diagnosis techniqu...
ITC
1998
IEEE
14 years 23 days ago
1998
IEEE
ITC
1998
IEEE
14 years 23 days ago
1998
IEEE
This paper explores defects found in a high volume microprocessor when shipping at a low defect level. A brief description of the manufacturing flow along with definition of DPM i...
ITC
1998
IEEE
14 years 23 days ago
1998
IEEE
The main objective of core-based IC design is improvement of design efficiency and time-to-market. In order to prevent test development from becoming the bottleneck in the entire ...
ITC
1998
IEEE
14 years 23 days ago
1998
IEEE
ITC
1998
IEEE
14 years 23 days ago
1998
IEEE
Previously-proposed strategies for VLSI fault diagnosis have su ered from a variety of self-imposed limitations. Some techniques are limited to a speci c fault model, and many wil...
ITC
1998
IEEE
14 years 23 days ago
1998
IEEE
The ability to make in-situ performance measurements of MEMS operating at high speeds has been demonstrated using a new image analysis system. Significant improvements in performa...
ITC
1998
IEEE
14 years 23 days ago
1998
IEEE
ITC
1998
IEEE
14 years 23 days ago
1998
IEEE
Existing high-level BIST synthesis methods focus on one objective, minimizing either area overhead or test time. Hence, those methods do not render exploration of large design spa...