― Phase Change Memory (PCM) is one of the most promising technologies among emerging non-volatile memories. PCM stores data in crystalline and amorphous phases of the GST materia...
-- The importance of within-die process variation and its impact on product yield has increased significantly with scaling. Within-die variation is typically monitored by embedding...
The impact of process variation in state of the art technology makes traditional (worst case) designs unnecessarily pessimistic, which translates to suboptimal designs in terms of...
The synthesis of clock network in the presence of process variation is becoming a vital design issue towards the performance of digital circuits. In this paper, we propose a clock ...
In the nanometer manufacturing region, process variation causes significant uncertainty for circuit performance verification. Statistical static timing analysis (SSTA) is thus dev...
In this paper, we present the design of a P4 (Power-PerformanceProcess-Parasitic) aware voltage controlled oscillator (VCO) at nanoCMOS technologies. Through simulations, we have ...
We model and verify analog designs in the presence of noise and process variation using an automated theorem prover, MetiTarski. Due to the statistical nature of noise, we propose ...
Rajeev Narayanan, Behzad Akbarpour, Mohamed H. Zak...
Abstract: This paper presents a new statistical methodology to simulate the effect of both inter-die and intra-die variation on the electrical performance of analog integrated circ...
Carlo Guardiani, Sharad Saxena, Patrick McNamara, ...
Transient Signal Analysis is a digital device testing method that is based on the analysis of voltage transients at multiple test points. In this paper, the power supply transient...
We propose an algorithm based on singular value decomposition (SVD) to reduce the number of process variation variables. With few process variation variables, fault simulation and...