TCAD
2002
14 years 2 months ago
2002
Test scheduling is an important problem in system-on-a-chip (SOC) test automation. Efficient test schedules minimize the overall system test application time, avoid test resource c...
ICCAD
1999
IEEE
14 years 7 months ago
1999
IEEE
We present optimal solutions to the test scheduling problem for core-based systems. We show that test scheduling is equivalent to the m-processor open-shop scheduling problem and ...
GLVLSI
2002
IEEE
14 years 8 months ago
2002
IEEE
We present a novel test scheduling algorithm for embedded corebased SoC’s. Given a system integrated with a set of cores and a set of test resources, we select a test for each c...
ISQED
2003
IEEE
14 years 8 months ago
2003
IEEE
An algorithm for mapping core terminals to System-On-a-Chip (SOC) I/O pins and scheduling tests in order to achieve costefficient concurrent test for core-based designs is present...
DFT
2003
IEEE
14 years 8 months ago
2003
IEEE
Test scheduling and Test Access Mechanism (TAM) design are two important tasks in the development of a System-on-Chip (SOC) test solution. Previous test scheduling techniques assu...
DSD
2005
IEEE
14 years 8 months ago
2005
IEEE
1 This paper presents a method for power-constrained system-on-chip test scheduling in an abort-on-first-fail environment where the test is terminated as soon as a fault is detecte...
DATE
2005
IEEE
14 years 8 months ago
2005
IEEE
Overheating has been acknowledged as a major issue in testing complex SOCs. Several power constrained system-level DFT solutions (power constrained test scheduling) have recently ...
ETS
2006
IEEE
14 years 9 months ago
2006
IEEE
In this paper we address the test scheduling problem for Builtin Self-tested (BISTed) embedded SRAMs (e-SRAMs) when Data Retention Faults (DRFs) are considered. The proposed test ...
DATE
2006
IEEE
14 years 9 months ago
2006
IEEE
In this paper, we propose a new method for test access and test scheduling in NoC-based system. It relies on a progressive reuse of the network resources for transporting test dat...
DATE
2006
IEEE
14 years 9 months ago
2006
IEEE
1 This paper presents a test scheduling approach for system-onchip production tests with peak-power constraints. An abort-onfirst-fail test approach is assumed, whereby the test is...