VTS
2005
IEEE
14 years 6 months ago
2005
IEEE
A new method for test resource partitioning is introduced which keeps the design-for-test logic independent of the test set and moves the test pattern dependent information to an ...
VTS
2005
IEEE
14 years 6 months ago
2005
IEEE
Nanometer circuits are highly susceptible to soft errors generated by alpha-particle or atmospheric neutron strikes to circuit nodes. The reasons for the high susceptibility are t...
VTS
2005
IEEE
14 years 6 months ago
2005
IEEE
VTS
2005
IEEE
14 years 6 months ago
2005
IEEE
An automated design procedure is described for synthesizing circuits with low power concurrent error detection. It is based on pre-synthesis selection of a parity-check code follo...
VTS
2005
IEEE
14 years 6 months ago
2005
IEEE
FPGA-based designs are more susceptible to single-event upsets (SEUs) compared to ASIC designs, since SEUs in configuration bits of FPGAs result in permanent errors in the mapped...
VTS
2005
IEEE
14 years 6 months ago
2005
IEEE
This paper presents a test architecture that addresses multiple problems faced in digital IC testing. These problems are test data volume, test application time, test power consum...
VTS
2005
IEEE
14 years 6 months ago
2005
IEEE
The power supply transient signal (IDDT) method that we propose for defect detection analyze regional signal variations introduced by defects at a set of power supply pads on the ...