67 search results - page 4 / 14 » Embedded Deterministic Test for Low-Cost Manufacturing Test |
DATE
2000
IEEE
13 years 12 months ago
2000
IEEE
In this paper, we give an overview of the trade-off to improve yield and optimize silicon manufacturing cost. The specific technology focus is on large embedded memories in comple...
DAC
2001
ACM
14 years 8 months ago
2001
ACM
Crosstalk effects degrade the integrity of signals traveling on long interconnects and must be addressed during manufacturing testing. External testing for crosstalk is expensive ...
ICCD
2004
IEEE
14 years 4 months ago
2004
IEEE
This paper introduces a new method for deterministic diagnosis of logic cores. The proposed method is based on onchip decompression and comparison of incompletely specified test ...
DATE
2005
IEEE
14 years 1 months ago
2005
IEEE
Both the number of embedded memories, as well as the total embedded memory content in our chips is growing steadily. Time for chip designers, EDA makers, and test engineers to upd...
DFT
2002
IEEE
14 years 14 days ago
2002
IEEE
This paper describes a new compression/decompression methodology for using an embedded processor to test the other components of a system-on-a-chip (SoC). The deterministic test v...