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» Gate Sizing Using a Statistical Delay Model
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DATE
2009
IEEE
93views Hardware» more  DATE 2009»
14 years 2 months ago
Test cost reduction for multiple-voltage designs with bridge defects through Gate-Sizing
Abstract—Multiple-voltage is an effective dynamic power reduction design technique. Recent research has shown that testing for resistive bridging faults in such designs requires ...
S. Saqib Khursheed, Bashir M. Al-Hashimi, Peter Ha...
DAC
2004
ACM
14 years 8 months ago
Statistical optimization of leakage power considering process variations using dual-Vth and sizing
timing analysis tools to replace standard deterministic static timing analyzers whereas [8,27] develop approaches for the statistical estimation of leakage power considering within...
Ashish Srivastava, Dennis Sylvester, David Blaauw
ISLPED
2003
ACM
142views Hardware» more  ISLPED 2003»
14 years 29 days ago
Minimization of dynamic and static power through joint assignment of threshold voltages and sizing optimization
We describe an optimization strategy for minimizing total power consumption using dual threshold voltage (Vth) technology. Significant power savings are possible by simultaneous a...
David Nguyen, Abhijit Davare, Michael Orshansky, D...
GLVLSI
2010
IEEE
190views VLSI» more  GLVLSI 2010»
13 years 9 months ago
A linear statistical analysis for full-chip leakage power with spatial correlation
In this paper, we present an approved linear-time algorithm for statistical leakage analysis in the present of any spatial correlation condition (strong or weak). The new algorith...
Ruijing Shen, Sheldon X.-D. Tan, Jinjun Xiong
FPGA
2007
ACM
142views FPGA» more  FPGA 2007»
14 years 1 months ago
Parametric yield in FPGAs due to within-die delay variations: a quantitative analysis
Variations in the semiconductor fabrication process results in variability in parameters between transistors on the same die, a problem exacerbated by lithographic scaling. The re...
N. Pete Sedcole, Peter Y. K. Cheung