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ISPD
2007
ACM
151views Hardware» more  ISPD 2007»
13 years 9 months ago
Pattern sensitive placement for manufacturability
When VLSI technology scales toward 45nm, the lithography wavelength stays at 193nm. This large gap results in strong refractive effects in lithography. Consequently, it is a huge...
Shiyan Hu, Jiang Hu
DAC
2008
ACM
14 years 8 months ago
DVFS in loop accelerators using BLADES
Hardware accelerators are common in embedded systems that have high performance requirements but must still operate within stringent energy constraints. To facilitate short time-t...
Ganesh S. Dasika, Shidhartha Das, Kevin Fan, Scott...
CODES
2005
IEEE
14 years 29 days ago
SOMA: a tool for synthesizing and optimizing memory accesses in ASICs
Arbitrary memory dependencies and variable latency memory systems are major obstacles to the synthesis of large-scale ASIC systems in high-level synthesis. This paper presents SOM...
Girish Venkataramani, Tiberiu Chelcea, Seth Copen ...
AOSD
2009
ACM
14 years 2 months ago
Modelling hardware verification concerns specified in the e language: an experience report
e is an aspect-oriented hardware verification language that is widely used to verify the design of electronic circuits through the development and execution of testbenches. In rec...
Darren Galpin, Cormac Driver, Siobhán Clark...
DDECS
2007
IEEE
201views Hardware» more  DDECS 2007»
14 years 1 months ago
Built in Defect Prognosis for Embedded Memories
: As scan compression replaces the traditional scan it is important to understand how it works with power. DFT MAX represents one of the two primary scan compression solutions used...
Prashant Dubey, Akhil Garg, Sravan Kumar Bhaskaran...