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    » On Fault Testing for Reversible Circuits
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    ICCAD
    2000
    IEEE
    100views Hardware» more  ICCAD 2000»
    Partial Simulation-Driven ATPG for Detection and Diagnosis of Faults in Analog Circuits
    15 years 12 months ago
    Partial Simulation-Driven ATPG for Detection and Diagnosis of Faults in Analog Circuits
    Download  www.cs.york.ac.uk
    In this paper, we propose a novel fault-oriented test generation methodology for detection and isolation of faults in analog circuits. Given the description of the circuit-underte...
    Sudip Chakrabarti, Abhijit Chatterjee
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    107
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    DATE
    2008
    IEEE
    76views Hardware» more  DATE 2008»
    On Modeling and Testing of Lithography Related Open Faults in Nano-CMOS Circuits
    16 years 1 months ago
    On Modeling and Testing of Lithography Related Open Faults in Nano-CMOS Circuits
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    Aswin Sreedhar, Alodeep Sanyal, Sandip Kundu
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    DATE
    2003
    IEEE
    73views Hardware» more  DATE 2003»
    Test Generation for Acyclic Sequential Circuits with Single Stuck-at Fault Combinational ATPG
    16 years 22 days ago
    Test Generation for Acyclic Sequential Circuits with Single Stuck-at Fault Combinational ATPG
    Download  www.date-conference.com
    Hideyuki Ichihara, Tomoo Inoue
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    ITC
    2002
    IEEE
    133views Hardware» more  ITC 2002»
    A DFT Technique for Low Frequency Delay Fault Testing in High Performance Digital Circuits
    16 years 10 days ago
    A DFT Technique for Low Frequency Delay Fault Testing in High Performance Digital Circuits
    Download  www.ece.uwaterloo.ca
    Bhaskar Chatterjee, Manoj Sachdev, Ali Keshavarzi
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    178
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    VLSID
    1995
    IEEE
    112views VLSI» more  VLSID 1995»
    An efficient automatic test generation system for path delay faults in combinational circuits
    15 years 11 months ago
    An efficient automatic test generation system for path delay faults in combinational circuits
    Download  eprints.iisc.ernet.in
    Ananta K. Majhi, James Jacob, Lalit M. Patnaik, Vi...
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