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372
search results - page 20 / 75
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On the Fault Testing for Reversible Circuits
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ICCAD
2000
IEEE
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Partial Simulation-Driven ATPG for Detection and Diagnosis of Faults in Analog Circuits
14 years 1 months ago
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In this paper, we propose a novel fault-oriented test generation methodology for detection and isolation of faults in analog circuits. Given the description of the circuit-underte...
Sudip Chakrabarti, Abhijit Chatterjee
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11
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DATE
2008
IEEE
76
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DATE 2008
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On Modeling and Testing of Lithography Related Open Faults in Nano-CMOS Circuits
14 years 3 months ago
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Aswin Sreedhar, Alodeep Sanyal, Sandip Kundu
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DATE
2003
IEEE
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DATE 2003
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Test Generation for Acyclic Sequential Circuits with Single Stuck-at Fault Combinational ATPG
14 years 1 months ago
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Hideyuki Ichihara, Tomoo Inoue
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ITC
2002
IEEE
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ITC 2002
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A DFT Technique for Low Frequency Delay Fault Testing in High Performance Digital Circuits
14 years 1 months ago
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Bhaskar Chatterjee, Manoj Sachdev, Ali Keshavarzi
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30
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VLSID
1995
IEEE
112
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VLSI
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VLSID 1995
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An efficient automatic test generation system for path delay faults in combinational circuits
14 years 4 days ago
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Ananta K. Majhi, James Jacob, Lalit M. Patnaik, Vi...
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