170 search results - page 3 / 34 » Online BIST for Embedded Systems |
DATE
2005
IEEE
14 years 1 months ago
2005
IEEE
Abstract—On a commercial digital still camera (DSC) controller chip we practice a novel SOC test integration platform, solving real problems in test scheduling, test IO reduction...
DELTA
2008
IEEE
14 years 1 months ago
2008
IEEE
Re-using embedded resources for implementing builtin self test mechanisms allows test cost reduction. In this paper we demonstrate how to implement costefficient built-in self tes...
TVLSI
1998
13 years 7 months ago
1998
Abstract—We introduce a technique for on-line built-in selftesting (BIST) of bus-based field programmable gate arrays (FPGA’s). This system detects deviations from the intende...
DFT
1999
IEEE
13 years 11 months ago
1999
IEEE
A programmable single-chip multiprocessor system for video coding has been developed. The system is implemented in a high-performance 0.25 m logic/embedded DRAM process. It integr...
DATE
2010
IEEE
14 years 15 days ago
2010
IEEE
—Many systems are based on embedded microcontrollers. Applications demand for production and Power-On testing, including memory testing. Because low-end microcontrollers may not ...