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FPGA
2007
ACM
142views FPGA» more  FPGA 2007»
14 years 2 months ago
Parametric yield in FPGAs due to within-die delay variations: a quantitative analysis
Variations in the semiconductor fabrication process results in variability in parameters between transistors on the same die, a problem exacerbated by lithographic scaling. The re...
N. Pete Sedcole, Peter Y. K. Cheung
ICCAD
2009
IEEE
117views Hardware» more  ICCAD 2009»
13 years 6 months ago
Binning optimization based on SSTA for transparently-latched circuits
With increasing process variation, binning has become an important technique to improve the values of fabricated chips, especially in high performance microprocessors where transpa...
Min Gong, Hai Zhou, Jun Tao, Xuan Zeng
AAAI
1997
13 years 10 months ago
Using CSP Look-Back Techniques to Solve Real-World SAT Instances
We report on the performance of an enhanced version of the “Davis-Putnam” (DP) proof procedure for propositional satisfiability (SAT) on large instances derived from realworld...
Roberto J. Bayardo Jr., Robert Schrag
ICCD
2001
IEEE
88views Hardware» more  ICCD 2001»
14 years 5 months ago
Jitter-Induced Power/ground Noise in CMOS PLLs: A Design Perspective
CMOS Phase-locked loops (PLL) are ubiquitous in RF and mixed-signal integrated circuits. PLLs are very sensitive to noise fluctuations on the power and ground rails. In this paper...
Payam Heydari, Massoud Pedram
DATE
2000
IEEE
100views Hardware» more  DATE 2000»
14 years 29 days ago
A New Approach for Computation of Timing Jitter in Phase Locked Loops
A new method for computation of timing jitter in a PLL is proposed. The computational method is based on the representation of the circuit as a linear time-varying system with mod...
Mark M. Gourary, Sergey G. Rusakov, Sergey L. Ulya...