ICCD
2008
IEEE
14 years 9 months ago
2008
IEEE
— Test-access mechanisms (TAMs) and test wrappers (e.g., the IEEE Standard 1500 wrapper) facilitate the modular testing of embedded cores in a core-based system-on-chip (SOC). Su...
ICCD
2008
IEEE
14 years 9 months ago
2008
IEEE
— Clock frequency and transistor density increases have resulted in elevated chip temperatures. In order to meet temperature constraints while still exploiting the performance op...
ICCD
2008
IEEE
14 years 9 months ago
2008
IEEE
High associativity is important for level-two cache designs [9]. Implementing CAM-based Highly Associative Caches (CAM-HAC), however, is both costly in hardware and exhibits poor s...
ICCD
2008
IEEE
14 years 9 months ago
2008
IEEE
- A gate level probabilistic error propagation model is presented which takes as input the Boolean function of the gate, the signal and error probabilities of the gate inputs, and ...
ICCD
2008
IEEE
14 years 9 months ago
2008
IEEE
—In this paper, a new FIR digital filter synthesis algorithm is proposed to consider multiple adder graphs for a coefficient. The proposed algorithm selects an adder graph that c...
ICCD
2008
IEEE
14 years 9 months ago
2008
IEEE
- In this paper, we analyze the impact of network contention on the application mapping for tile-based Networkon-Chip (NoC) architectures. Our main theoretical contribution consist...
ICCD
2008
IEEE
14 years 9 months ago
2008
IEEE
Abstract—Multiprocessor architectures are becoming popular in both desktop and mobile processors. Among multiprocessor architectures, asymmetric architectures show promise in sav...
ICCD
2008
IEEE
14 years 9 months ago
2008
IEEE
— Embedded processors are required to achieve high performance while running on batteries. Thus, they must exploit all the possible means available to reduce energy consumption w...
ICCD
2008
IEEE
14 years 9 months ago
2008
IEEE
— This paper looks at designing circuit elements that will be constructed with nanoscale magnets within the Quantum-dot Cellular Automata (QCA) computational paradigm. In magneti...
ICCD
2008
IEEE
14 years 9 months ago
2008
IEEE
—Nanoscale integrated circuits are becoming increasingly sensitive to radiation-induced transient faults (soft errors) due to current technology scaling trends, such as shrinking...