VTS
1999
IEEE
14 years 1 months ago
1999
IEEE
Sequential test generators fail to yield tests for some stuck-at-faults because they are unable to reach certain states necessary for exciting propagating these target faults. Add...
VTS
1999
IEEE
14 years 1 months ago
1999
IEEE
VTS
1999
IEEE
14 years 1 months ago
1999
IEEE
This paper describes an approach to design error diagnosis and correction in combinational digital circuits. Our approach targets small errors introduced during the design process...
VTS
1999
IEEE
14 years 1 months ago
1999
IEEE
This paper presents a new technique for on-line consistency checking of embedded DRAMs. The basic idea is to use the periodic refresh operation for concurrently computing a test c...
VTS
1999
IEEE
14 years 1 months ago
1999
IEEE
High-level test pattern generation is today a widely investigated research topic. The present paper proposes a fully automated, simulation-based ATPG system, to address test patte...
VTS
1999
IEEE
14 years 1 months ago
1999
IEEE
This paper presents adaptive techniques for improving delay fault diagnosis. These techniques reduce the search space for direct probing which can save a lot of time during failur...
VTS
1999
IEEE
14 years 1 months ago
1999
IEEE
A low-cost on-line test scheme for digital filters is proposed. The scheme uses an invariant of the digital filter, the frequency response at specific points, in order to detect p...
VTS
1999
IEEE
14 years 1 months ago
1999
IEEE
Ground bounce in internal circuitry is becoming an important design validation and test issue. In this paper a new circuit model for ground bounce in internal circuitry is propose...
FPL
1999
Springer
14 years 1 months ago
1999
Springer
FPL
1999
Springer
14 years 1 months ago
1999
Springer