MICRO
2000
IEEE
14 years 1 months ago
2000
IEEE
The design and implementation of a modern microprocessor creates many reliability challenges. Designers must verify the correctness of large complex systems and construct implemen...
MICRO
2000
IEEE
14 years 1 months ago
2000
IEEE
We investigate instruction distribution methods for quadcluster, dynamically-scheduled superscalar processors. We study a variety of methods with different cost, performance and c...
MICRO
2000
IEEE
14 years 1 months ago
2000
IEEE
ITC
2000
IEEE
14 years 1 months ago
2000
IEEE
A wrapper is a thin shell around the core, that provides the switching between functional, and core-internal and core-external test modes. Together with a test access mechanism (T...
ITC
2000
IEEE
14 years 1 months ago
2000
IEEE
ITC
2000
IEEE
14 years 1 months ago
2000
IEEE
ITC
2000
IEEE
14 years 1 months ago
2000
IEEE
ITC
2000
IEEE
14 years 1 months ago
2000
IEEE
Transient Signal Analysis (TSA) is a Go/No-Go device testing method that is based on the analysis of voltage transients at multiple test points. In this paper, a technique based o...
ITC
2000
IEEE
14 years 1 months ago
2000
IEEE
Boards have evolved into complex systems and even collections of interacting systems. Test engineers struggle to find out how these systems are initialized and booted because of p...
ITC
2000
IEEE
14 years 1 months ago
2000
IEEE
Concurrent error detection (CED) techniques (based on hardware duplication, parity codes, etc.) are widely used to enhance system dependability. All CED techniques introduce some ...