The design and implementation of a modern microprocessor creates many reliability challenges. Designers must verify the correctness of large complex systems and construct implemen...
Saugata Chatterjee, Christopher T. Weaver, Todd M....
We investigate instruction distribution methods for quadcluster, dynamically-scheduled superscalar processors. We study a variety of methods with different cost, performance and c...
A wrapper is a thin shell around the core, that provides the switching between functional, and core-internal and core-external test modes. Together with a test access mechanism (T...
Yervant Zorian, Erik Jan Marinissen, Maurice Lousb...
Transient Signal Analysis (TSA) is a Go/No-Go device testing method that is based on the analysis of voltage transients at multiple test points. In this paper, a technique based o...
James F. Plusquellic, Amy Germida, Jonathan Hudson...
Boards have evolved into complex systems and even collections of interacting systems. Test engineers struggle to find out how these systems are initialized and booted because of p...
Concurrent error detection (CED) techniques (based on hardware duplication, parity codes, etc.) are widely used to enhance system dependability. All CED techniques introduce some ...