DATE
2000
IEEE
14 years 1 months ago
2000
IEEE
: IC technologies are approaching the ultimate limits of silicon in terms of channel width, power supply and speed. By approaching these limits, circuits are becoming increasingly ...
DATE
2000
IEEE
14 years 1 months ago
2000
IEEE
The design process for an engine management system is presented. The functional specification of the system has been captured using C and C++ as specification languages. The val...
DATE
2000
IEEE
14 years 1 months ago
2000
IEEE
c Abstraction for Worst-Case Analysis of Discrete Systems Felice Balarin Cadence Berkeley Laboratories Recently, a methodology for worst-case analysis of discrete systems has been...
DATE
2000
IEEE
14 years 1 months ago
2000
IEEE
In this paper, we introduce a discrete-time model for the complete power supply sub-system that closely approximates the behavior of its circuit-level (i.e., HSpice), continuous-t...
ATS
2000
IEEE
14 years 1 months ago
2000
IEEE
Testing of embedded cores is very difficult in SOC (system-on-a-chip), since the core user may not know the gate level implementation of the core, and the controllability and obse...
ATS
2000
IEEE
14 years 1 months ago
2000
IEEE
We present a new pseudorandom testing algorithm for the Built-In Self-Test (BIST) of DRAM. In this algorithm, test patterns are complemented to generate state-transitions that are...
ATS
2000
IEEE
14 years 1 months ago
2000
IEEE
At very high frequencies, the major potential of asynchronous circuits is absence of clock skew and, through that, better exploitation of relative timing relations. This paper pre...
ATS
2000
IEEE
14 years 1 months ago
2000
IEEE
ATS
2000
IEEE
14 years 1 months ago
2000
IEEE
ATS
2000
IEEE
14 years 1 months ago
2000
IEEE
: In this paper a complete analysis of spot defects in industrial SRAMs will be presented. All possible defects are simulated, and the resulting electrical faults are transformed i...