ICCD
2005
IEEE
14 years 2 months ago
2005
IEEE
As power density increases exponentially, run-time regulation of operating temperature by dynamic thermal management becomes imperative. This paper proposes a novel approach to re...
ICCD
2005
IEEE
14 years 2 months ago
2005
IEEE
— With the success of formal verification techniques like equivalence checking and model checking for hardware designs, there has been growing interest in applying such techniqu...
ICCD
2005
IEEE
14 years 2 months ago
2005
IEEE
ICCD
2005
IEEE
14 years 2 months ago
2005
IEEE
— In this work we investigate the buffer insertion problem under process variations. Sub 100-nm fabrication process causes significant variations on many design parameters. We p...
ICCAD
2005
IEEE
14 years 2 months ago
2005
IEEE
— Balanced truncation (BT) model order reduction (MOR) is known for its superior accuracy and computable error bounds. Balanced stochastic truncation (BST) is a particular BT pro...
ICCAD
2005
IEEE
14 years 2 months ago
2005
IEEE
Physics-based compact modeling, as opposed to the conventional empirical approach, is emphasized for nanoscale nonclassical CMOS. UFDG, a physics-based compact model for generic d...
ICCAD
2005
IEEE
14 years 2 months ago
2005
IEEE
ICCAD
2005
IEEE
14 years 2 months ago
2005
IEEE
ICCAD
2005
IEEE
14 years 2 months ago
2005
IEEE
Thermal simulations are important for advanced electronic systems at multiple length scales. A major challenge involves electrothermal phenomena within nanoscale transistors, whic...
ICCAD
2005
IEEE
14 years 2 months ago
2005
IEEE
— Batteries are non-ideal energy sources – minimizing the energy consumption of a battery-powered system is not equivalent to maximizing its battery life. We propose an alterna...