DATE
2006
IEEE
14 years 3 months ago
2006
IEEE
DATE
2006
IEEE
14 years 3 months ago
2006
IEEE
The problem of diagnosis – or locating the source of an error or fault – occurs in several areas of Computer Aided Design, such as dynamic verification, property checking, eq...
DATE
2006
IEEE
14 years 3 months ago
2006
IEEE
DATE
2006
IEEE
14 years 3 months ago
2006
IEEE
This paper presents an Application Specific Instruction Set Processor (ASIP) design for the implementation of a class of nonlinear image processing algorithms, the Retinex-like fi...
DATE
2006
IEEE
14 years 3 months ago
2006
IEEE
DATE
2006
IEEE
14 years 3 months ago
2006
IEEE
DATE
2006
IEEE
14 years 3 months ago
2006
IEEE
We propose a novel methodology to generate Application Specific Instruction Processors (ASIPs) including custom instructions. Our implementation balances performance and area req...
DATE
2006
IEEE
14 years 3 months ago
2006
IEEE
In this paper we analyze the test power of SRAM memories and demonstrate that the full functional precharge activity is not necessary during test mode because of the predictable a...
DATE
2006
IEEE
14 years 3 months ago
2006
IEEE
Because of its excellent bit-error-rate performance, the Low-Density Parity-Check (LDPC) algorithm is gaining increased attention in communication standards and literature. The ne...
DATE
2006
IEEE
14 years 3 months ago
2006
IEEE
Pseudorandom test techniques are widely used for measuring the impulse response (IR) for linear devices and Volterra kernels for nonlinear devices, especially in the acoustics dom...