ISQED
2007
IEEE
14 years 3 months ago
2007
IEEE
This paper studies the impact of variability on the noise robustness of logic gates using noise rejection curves (NRCs). NRCs allow noise pulses to be modeled using magnitude-dura...
ISQED
2007
IEEE
14 years 3 months ago
2007
IEEE
Negative bias temperature instability (NBTI) has come to the forefront of critical reliability phenomena in advanced CMOS technology. In this paper, we propose a fast and accurate...
ISQED
2007
IEEE
14 years 3 months ago
2007
IEEE
According to the current trend of increasing variations in process technologies and thus in performance, the conservative worst-case design will not work since design margins can ...
ISQED
2007
IEEE
14 years 3 months ago
2007
IEEE
In high-level synthesis for FPGA designs, scheduling and chaining of operations for optimal performance remain challenging problems. In this paper, we present a balanced schedulin...
ISQED
2007
IEEE
14 years 3 months ago
2007
IEEE
We present a methodology for the simulation of soft errors targeting future nano-technological devices. This approach efficiently scales the failure rate of individual devices ac...
ISQED
2007
IEEE
14 years 3 months ago
2007
IEEE
For emerging deep-subwavelength lithography technologies (90 nm and following) the data volume and the complexity of Optical Proximity Correction (OPC) have increased dramatically...
ISQED
2007
IEEE
14 years 3 months ago
2007
IEEE
The virtual channel flow control (VCFC) provides an efficient implementation for on-chip networks. However, allocating the virtual channels (VCs) uniformly results in a waste of a...
ISQED
2007
IEEE
14 years 3 months ago
2007
IEEE
Errors caused by tolerance variations and mismatches among components severely degrade the performance of integrated circuits. These random effects in process parameters significa...
ISQED
2007
IEEE
14 years 3 months ago
2007
IEEE
Due to the shrinking of feature size and reduction in supply voltages, nanoscale circuits have become more susceptible to radiation induced transient faults. In this paper, we use...
ISQED
2007
IEEE
14 years 3 months ago
2007
IEEE
In nanometer regime, the effects of variations are having an increasing impact on the delay and power characteristics of devices as well as the yield of the circuit. Statistical t...