DFT
2007
IEEE
14 years 3 months ago
2007
IEEE
Growth of pixel density and sensor array size increases the likelihood of developing in-field pixel defects. An ongoing study on defect development in imagers has now provided us ...
DFT
2007
IEEE
14 years 3 months ago
2007
IEEE
The network-on-chip (NoC) paradigm is seen as a way of facilitating the integration of a large number of computational and storage blocks on a chip to meet several performance and...
DFT
2007
IEEE
14 years 3 months ago
2007
IEEE
During semiconductor manufacturing, particles undesirably depose on the surface of the wafer causing “open” and “short” defects to interconnects. In this paper, a third ty...
DFT
2007
IEEE
14 years 3 months ago
2007
IEEE
The paper discusses a novel approach for reduction of fault detection latency in a selfchecking sequential circuit. The Authors propose decomposing the finite state machine (FSM) ...
DFT
2007
IEEE
14 years 3 months ago
2007
IEEE
Many side-channel attacks on implementations of cryptographic algorithms have been developed in recent years demonstrating the ease of extracting the secret key. In response, vari...
DFT
2007
IEEE
14 years 3 months ago
2007
IEEE
Solid-state image sensors develop in-field defects in all common environments. Experiments have demonstrated the growth of significant quantities of hot-pixel defects that degrade...
DFT
2007
IEEE
14 years 3 months ago
2007
IEEE
Chemically Assembled Electronic Nanotechnology is a promising alternative to CMOS fabrication. In particular, the nanoFabric has proven to be a viable solution for implementing di...
DFT
2007
IEEE
14 years 3 months ago
2007
IEEE
This paper presents a new routing protocol of network-on-chip(Noc) called ‘Source Routing for Noc’(SRN) for fault tolerant communication of Systems-on-chip(Soc). The proposed ...
DFT
2007
IEEE
14 years 3 months ago
2007
IEEE
We propose and evaluate the use of lazy error detection for a superscalar, out-of-order microprocessor’s functional units. The key insight is that error detection is off the cri...
DFT
2007
IEEE
14 years 3 months ago
2007
IEEE
In the paper, a methodology of developing checkers for communication protocol testing is presented. It was used to develop checker to test IP cores communication protocol implemen...