192 search results - page 4 / 39 » Functional Scan Chain Testing |
VTS
2008
IEEE
14 years 3 months ago
2008
IEEE
VTS
2007
IEEE
14 years 3 months ago
2007
IEEE
A methodology is presented for improving the amount of compression achieved by continuous-flow decompressors by using multiple ratios of scan chains to tester channels (i.e., expa...
DAC
2001
ACM
14 years 10 months ago
2001
ACM
DATE
2006
IEEE
14 years 3 months ago
2006
IEEE
A concurrent core test approach is proposed to reduce the test cost of SOC. Multiple cores in SOC can be tested simultaneously by using a shared test set and scan chain disable. P...
ITC
2003
IEEE
14 years 2 months ago
2003
IEEE
