225 search results - page 7 / 45 » Sequential Circuits for Relational Analysis |
DATE
2007
IEEE
14 years 4 months ago
2007
IEEE
This paper presents a built-in self-test (BiST) scheme for analog to digital converters (ADC) based on a linear ramp generator and efficient output analysis. The proposed analysi...
ISQED
2009
IEEE
14 years 4 months ago
2009
IEEE
With technology scaling, the occurrence rate of not only single, but also multiple transients resulting from a single hit is increasing. In this work, we consider the effect of th...
ICCAD
1995
IEEE
14 years 1 months ago
1995
IEEE
This paper investigates the effect of the controller on the testability of sequential circuits composed of controllers and data paths. It is shown that even when both the controll...
ISQED
2010
IEEE
14 years 2 months ago
2010
IEEE
We analyze the neutron induced soft error rate (SER) by modeling induced error pulse using two parameters, occurrence frequency and probability density function for the pulse widt...
ICCAD
2004
IEEE
14 years 6 months ago
2004
IEEE
Traditional timing-driven placement considers only combinational delays and does not take into account the potential of subsequent sequential optimization steps. As a result, the ...