New methodologies based on functional testing and built-in self-test can narrow the gap between necessary solutions and existing techniques for processor validation and testing. W...
Automated fault diagnosis based on the stuckat fault model is not always effective. This paper presents practical experiences in applying a bridging fault based diagnosis techniqu...
Jayashree Saxena, Kenneth M. Butler, Hari Balachan...
This paper explores defects found in a high volume microprocessor when shipping at a low defect level. A brief description of the manufacturing flow along with definition of DPM i...
The main objective of core-based IC design is improvement of design efficiency and time-to-market. In order to prevent test development from becoming the bottleneck in the entire ...
Erik Jan Marinissen, Robert G. J. Arendsen, Gerard...
Previously-proposed strategies for VLSI fault diagnosis have su ered from a variety of self-imposed limitations. Some techniques are limited to a speci c fault model, and many wil...
David B. Lavo, Brian Chess, Tracy Larrabee, Ismed ...
The ability to make in-situ performance measurements of MEMS operating at high speeds has been demonstrated using a new image analysis system. Significant improvements in performa...