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    MR
    2007
    157views Robotics» more  MR 2007»
    Electronic prognostics - A case study using global positioning system (GPS)
    13 years 11 months ago
    Electronic prognostics - A case study using global positioning system (GPS)
    Download  www.impact-tek.com
    – Prognostic health management (PHM) of electronic systems presents challenges traditionally viewed as either insurmountable or otherwise not worth the cost of pursuit. Recent ch...
    Douglas W. Brown, Patrick W. Kalgren, Carl S. Byin...
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    MR
    2007
    92views Robotics» more  MR 2007»
    Feature extraction and damage-precursors for prognostication of lead-free electronics
    13 years 11 months ago
    Feature extraction and damage-precursors for prognostication of lead-free electronics
    Download  cave.auburn.edu
    Damage pre-cursors based health management and prognostication methodology has been presented for electronic systems in harsh environments. The framework has been developed based ...
    Pradeep Lall, Madhura Hande, Chandan Bhat, Nokibul...
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    MR
    2007
    79views Robotics» more  MR 2007»
    Reliability of spring pressure contacts under environmental stress
    13 years 11 months ago
    Reliability of spring pressure contacts under environmental stress
    Download  www.semikron.com
    Spring contacts are an excellent solution for connecting a power module with a printed circuit board (PCB). They can be applied in a wide current range from sensor currents of a f...
    F. Lang, U. Scheuermann
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    MR
    2007
    107views Robotics» more  MR 2007»
    Cohesive zone modeling for structural integrity analysis of IC interconnects
    13 years 11 months ago
    Cohesive zone modeling for structural integrity analysis of IC interconnects
    Download  www.mate.tue.nl
    Due to the miniaturization of integrated circuits, their thermo-mechanical reliability tends to become a truly critical design criterion.
    B. A. E. van Hal, R. H. J. Peerlings, M. G. D. Gee...
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    MR
    2007
    120views Robotics» more  MR 2007»
    Advanced electronic prognostics through system telemetry and pattern recognition methods
    13 years 11 months ago
    Advanced electronic prognostics through system telemetry and pattern recognition methods
    Download  www.prognostics.umd.edu
    Electronic Prognostics (EP) is a technique used in high-reliability and high-availability systems to actively and proactively detect faults, allowing the reduction of system downt...
    Leon Lopez
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    MR
    2007
    96views Robotics» more  MR 2007»
    A step by step methodology to analyze the IGBT failure mechanisms under short circuit and turn-off inductive conditions using 2D
    13 years 11 months ago
    A step by step methodology to analyze the IGBT failure mechanisms under short circuit and turn-off inductive conditions using 2D
    Download  hal.archives-ouvertes.fr
    A systematic methodology is developed in order to clarify the punch through Trench Insulated Gate Bipolar Transistor (T-IGBT) failure mechanisms which can occur under extreme oper...
    A. Benmansour, Stephane Azzopardi, J. C. Martin, E...
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    MR
    2007
    66views Robotics» more  MR 2007»
    Test structures for dielectric spectroscopy of thin films at microwave frequencies
    13 years 11 months ago
    Test structures for dielectric spectroscopy of thin films at microwave frequencies
    Download  www2.unipr.it
    This work describes the application of two different test structures to execute broadband microwave measurements of the dielectric constant of ceramic thin films. Coplanar wavegui...
    Nicola Delmonte, B. E. Watts, G. Chiorboli, P. Cov...
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    MR
    2007
    127views Robotics» more  MR 2007»
    A comprehensive model for PMOS NBTI degradation: Recent progress
    13 years 11 months ago
    A comprehensive model for PMOS NBTI degradation: Recent progress
    Download  cobweb.ecn.purdue.edu
    Muhammad Ashraful Alam, Haldun Kufluoglu, D. Vargh...
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    MR
    2007
    83views Robotics» more  MR 2007»
    Active ESD protection circuit design against charged-device-model ESD event in CMOS integrated circuits
    13 years 11 months ago
    Active ESD protection circuit design against charged-device-model ESD event in CMOS integrated circuits
    Download  www.ics.ee.nctu.edu.tw
    CDM ESD event has become the main ESD reliability concern for integrated-circuits products using nanoscale CMOS technology. A novel CDM ESD protection design, using self-biased cu...
    Shih-Hung Chen, Ming-Dou Ker
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    MR
    2007
    144views Robotics» more  MR 2007»
    Trench IGBT failure mechanisms evolution with temperature and gate resistance under various short-circuit conditions
    13 years 11 months ago
    Trench IGBT failure mechanisms evolution with temperature and gate resistance under various short-circuit conditions
    Download  hal.archives-ouvertes.fr
    Two extreme configurations under short circuit conditions leading to the punch through Trench IGBT failure under the effect of the temperature and the gate resistance have been st...
    A. Benmansour, Stephane Azzopardi, J. C. Martin, E...
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