DFT
2006
IEEE
14 years 1 months ago
2006
IEEE
As the technology enters the nano dimension, the inherent unreliability of nanoelectronics is making fault-tolerant architectures increasingly necessary in building nano systems. ...
GLVLSI
2010
IEEE
14 years 1 months ago
2010
IEEE
Loop caches provide an effective method for decreasing memory hierarchy energy consumption by storing frequently executed code in a more energy efficient structure than the level ...
GLVLSI
2010
IEEE
14 years 1 months ago
2010
IEEE
As the rated performance of microprocessors increases, voltage droop emergencies become a significant problem. In this paper, two new techniques to combat voltage droop emergencie...
GLVLSI
2010
IEEE
14 years 1 months ago
2010
IEEE
In this paper, we present an approved linear-time algorithm for statistical leakage analysis in the present of any spatial correlation condition (strong or weak). The new algorith...
GLVLSI
2010
IEEE
14 years 1 months ago
2010
IEEE
For timing-driven or yield-driven designs, non-tree routing has become more and more popular and additional loops provide the redundant paths to protect against the effect of the ...
GLVLSI
2010
IEEE
14 years 1 months ago
2010
IEEE
This paper describes a physics-based semi-analytical model for Schottky-barrier carbon nanotube (CNT) and graphene nanoribbon (GNR) transistors. The model includes the treatment o...
GLVLSI
2010
IEEE
14 years 1 months ago
2010
IEEE
Transistor aging effects (NBTI and PBTI) impact the reliability of SRAM in nano-scale CMOS technologies. In this research, the combined effect of NBTI and PBTI on power gated SRAM...
GLVLSI
2009
IEEE
14 years 2 months ago
2009
IEEE
In this paper, a novel design is proposed for eliminating glitches and signal bounces during wake-up events that result from incorporating multi-threshold CMOS (MTCMOS) into async...
GLVLSI
2009
IEEE
14 years 2 months ago
2009
IEEE
DFT
2009
IEEE
14 years 2 months ago
2009
IEEE
Optimizing the BIST configuration based on the characteristics of the design under test is a complicated and challenging work for test engineers. Since this problem has multiple o...