ITC
2003
IEEE
14 years 2 months ago
2003
IEEE
We present an efficient algorithm for identification of two-line bridges in combinational CMOS logic that narrows down the two-line bridge candidates based on tester responses for...
ITC
2003
IEEE
14 years 2 months ago
2003
IEEE
–This paper provides proof of concept for the newly-approved 1149.6 standard by investigating the first silicon implementation of the test receiver. EXTEST and EXTEST_PULSE tests...
ITC
2003
IEEE
14 years 2 months ago
2003
IEEE
ITC
2003
IEEE
14 years 2 months ago
2003
IEEE
NPTest CMOS formatter, embedded within the new timing generation IC, can provide formatted levels and internal strobe markers for eight independent pinelectronics channels at up t...
ITC
2003
IEEE
14 years 2 months ago
2003
IEEE
ITC
2003
IEEE
14 years 2 months ago
2003
IEEE
– It is well known that the output signals measured by an automatic test equipment (ATE) system are not only due to the device-under-test (DUT), but also due to the test path. Fo...
ITC
2003
IEEE
14 years 2 months ago
2003
IEEE
Diagnosing failing vectors in a Built-In Self Test (BIST) environment is a difficult task because of the highly compressed signature coming out of the Multiple Input Shift Regist...
ITC
2003
IEEE
14 years 2 months ago
2003
IEEE
For ratio-Iddq testing, the test performance is significantly affected by the correlation between two currents of different input patterns as process parameters vary. In this p...
ITC
2003
IEEE
14 years 2 months ago
2003
IEEE
Composite microsystems that integrate mechanical and fluidic components are fast emerging as the next generation of system-on-chip designs. As these systems become widespread in s...
ITC
2003
IEEE
14 years 2 months ago
2003
IEEE
Abstract: We discuss the development of Built-In SelfTest (BIST) configurations that test all of the programmable logic and interconnect resources in the core of Xilinx 4000E, 4000...