ITC
2003
IEEE
14 years 2 months ago
2003
IEEE
ITC
2003
IEEE
14 years 2 months ago
2003
IEEE
A technique to derive test vectors that exercise the worstcase delay effects in a domino circuit in the presence of crosstalk is described. A model for characterizing the delay of...
ITC
2003
IEEE
14 years 2 months ago
2003
IEEE
This paper proposes an architecture for implementing a self-checking 4-bit carry select adder that can be extended to any n-bit addition. The overhead is directly proportional to ...
ITC
2003
IEEE
14 years 2 months ago
2003
IEEE
Current-based tests are the most effective methods available to detect resistive shorts. Delta IDDQ testing is the most sensitive variant and can handle off-state currents of 10-1...
ITC
2003
IEEE
14 years 2 months ago
2003
IEEE
This paper describes a new post-silicon validation problem for diagnosing systematic timing errors. We illustrate the differences between timing validation and the traditional log...
ITC
2003
IEEE
14 years 2 months ago
2003
IEEE
Creating functional tests that work on an ATE has always been a significant challenge [1]. This paper identifies the fundamental mechanisms for functional test failures of an SOC ...
ITC
2003
IEEE
14 years 2 months ago
2003
IEEE
ITC
2003
IEEE
14 years 2 months ago
2003
IEEE
Deliberate injection of faults into cryptographic devices is an effective cryptanalysis technique against symmetric and asymmetric encryption. We will describe a general concurren...
ITC
2003
IEEE
14 years 2 months ago
2003
IEEE
This paper describes an Addressable Shadow Protocol device that is capable of providing connectivity between a backplane resident IEEE 1149.1 test bus master and a plurality of 11...
ITC
2003
IEEE
14 years 2 months ago
2003
IEEE
Many of the semiconductor technologies are already facing limitations while new-generation data and telecommunication systems are implemented. Although in its infancy, superconduc...