In this paper, we analyze failing circuits and propose a multiple-fault diagnosis approach. Our methodology has been validated experimentally and has proved to be highly efficient...
In this paper, we study the possibility of using logic defect-level prediction models to predict the detection behavior of statistical timing defects. We compare two known logic m...
Li-C. Wang, Angela Krstic, Leonard Lee, Kwang-Ting...
Failure analysis (FA) and diagnosis of memory cores plays a key role in system-on-chip (SOC) product development and yield ramp-up. Conventional FA based on bitmaps and the experi...
MEMS processes and components are rapidly changing in device design, processing, and, most importantly, application. This paper will discuss the future challenges faced by the MEM...
Many of the tools and techniques used to evaluate and characterize ICs can be applied to MEMS technology. In this paper we discuss various tools and techniques used to provide str...
MEMS components by their very nature have different and unique failure mechanisms than their macroscopic counterparts. This paper discusses failure mechanisms observed in various ...
While the IEEE P1500 standards working group is on the verge of recommending a standard test interface for "non-mergeable" cores, a need was felt to adopt a standard met...
Michael G. Wahl, Sudipta Bhawmik, Kamran Zarrineh,...
This paper presents an approach for reducing the test data volume that has to be stored in ATE vector memory for IC manufacturing testing. We exploit the capabilities of present A...
Harald P. E. Vranken, Friedrich Hapke, Soenke Rogg...