We present a novel methodology for concurrent error detection in linear analog circuits. We develop a rigorous theory that yields an error detection circuit of size that is, in ge...
Backside light emission and electrical measurements were used to evaluate the susceptibility to latchup of externally cabled I/O pins for a 0.13 µm technology generation [1,2] te...
Franco Stellari, Peilin Song, Moyra K. McManus, Ro...
This paper is a technology review of PXI. It describes the basic PXI architecture and looks in more detail at the features of the slot 2 timing and triggering module.
This paper presents a technique to improve verification at the VHDL level of digital circuits by means of a specially designed fault injection block. The injection technique allow...
Burn-in faces significant challenges in recent CMOS technologies. The self-generated heat of each IC in a burn-in environment contributes to larger currents that can lead to furth...
Oleg Semenov, Arman Vassighi, Manoj Sachdev, Ali K...
Very Deep Sub-Micron (VDSM) defects are resolved as Statistical Post-Processing™ (SPP) outliers of a new IDDQ screen. The screen applies an IDDQ pattern once to the Device Under...
Chris Schuermyer, Brady Benware, Kevin Cota, Rober...
At-speed test has become a requirement in IC technologies below 180 nm. Unfortunately, test mode switching activity and IR-drop present special challenges to the successful applic...
Jayashree Saxena, Kenneth M. Butler, Vinay B. Jaya...
This paper describes a system for performing high precision IDDQ measurement of CMOS ICs having a large peak current during operation. Although the measurement rate is at a low sp...
A scalable laser-based timing analysis technique we call laser assisted device alteration (LADA) is introduced for the rapid isolation and analysis of defect-free performance limi...
This paper introduces a finite memory compactor called convolutional compactor that provides compaction ratios of test responses in excess of 100x even for a very small number of ...
Janusz Rajski, Jerzy Tyszer, Chen Wang, Sudhakar M...