ITC
2003
IEEE
14 years 2 months ago
2003
IEEE
We present a novel methodology for concurrent error detection in linear analog circuits. We develop a rigorous theory that yields an error detection circuit of size that is, in ge...
ITC
2003
IEEE
14 years 2 months ago
2003
IEEE
Backside light emission and electrical measurements were used to evaluate the susceptibility to latchup of externally cabled I/O pins for a 0.13 µm technology generation [1,2] te...
ITC
2003
IEEE
14 years 2 months ago
2003
IEEE
This paper is a technology review of PXI. It describes the basic PXI architecture and looks in more detail at the features of the slot 2 timing and triggering module.
ITC
2003
IEEE
14 years 2 months ago
2003
IEEE
This paper presents a technique to improve verification at the VHDL level of digital circuits by means of a specially designed fault injection block. The injection technique allow...
ITC
2003
IEEE
14 years 2 months ago
2003
IEEE
Burn-in faces significant challenges in recent CMOS technologies. The self-generated heat of each IC in a burn-in environment contributes to larger currents that can lead to furth...
ITC
2003
IEEE
14 years 2 months ago
2003
IEEE
Very Deep Sub-Micron (VDSM) defects are resolved as Statistical Post-Processing™ (SPP) outliers of a new IDDQ screen. The screen applies an IDDQ pattern once to the Device Under...
ITC
2003
IEEE
14 years 2 months ago
2003
IEEE
At-speed test has become a requirement in IC technologies below 180 nm. Unfortunately, test mode switching activity and IR-drop present special challenges to the successful applic...
ITC
2003
IEEE
14 years 2 months ago
2003
IEEE
This paper describes a system for performing high precision IDDQ measurement of CMOS ICs having a large peak current during operation. Although the measurement rate is at a low sp...
ITC
2003
IEEE
14 years 2 months ago
2003
IEEE
A scalable laser-based timing analysis technique we call laser assisted device alteration (LADA) is introduced for the rapid isolation and analysis of defect-free performance limi...
ITC
2003
IEEE
14 years 2 months ago
2003
IEEE
This paper introduces a finite memory compactor called convolutional compactor that provides compaction ratios of test responses in excess of 100x even for a very small number of ...