ITC
2003
IEEE
14 years 2 months ago
2003
IEEE
Defect tolerance will become more important as feature sizes shrink closer to single digit nanometer dimensions. This is true whether the chips are manufactured using topdown meth...
ITC
2003
IEEE
14 years 2 months ago
2003
IEEE
This paper presents an attempt of using intelligent agents for testing and repairing a distributed system, whose elements may or may not have embedded BIST (Built-In Self-Test) an...
ITC
2003
IEEE
14 years 2 months ago
2003
IEEE
In this paper we introduce a tool which is capable of verifying an 1149.1 test logic implementation and its compliance to the IEEE 1149.1 Standard [1][2] while providing a precise...
ITC
2003
IEEE
14 years 2 months ago
2003
IEEE
The DFT and Test challenges faced, and the solutions applied, to the ARM1026EJ microprocessor core are described in this paper. New DFT techniques have been created to address the...
ITC
2003
IEEE
14 years 2 months ago
2003
IEEE
— Being able to test the intrinsic performance of a device under test (DUT) has always been the main goal of a test engineer. Achieving this goal is becoming increasingly diffic...
ITC
2003
IEEE
14 years 2 months ago
2003
IEEE
Electrical testing of MicroElectroMechanical Systems (MEMS) can take on many different forms including wafer probing, electrical trimming, final test at temperatures, engineering ...
ITC
2003
IEEE
14 years 2 months ago
2003
IEEE
This paper argues that the existing approaches to modeling and characterization of IC malfunctions are inadequate for test and yield learning of Deep Sub-Micron (DSM) products. Tr...
ITC
2003
IEEE
14 years 2 months ago
2003
IEEE
A BIST method measures accumulated jitter over N periods and requires no external references. Simulation using a 0.25um process shows a 625MHz - 1GHz input range with resolution o...
ITC
2003
IEEE
14 years 2 months ago
2003
IEEE
Embedded memories are among the most widely used cores in current system-on-chip (SOC) implementations. Memory cores usually occupy a significant portion of the chip area, and do...
ITC
2003
IEEE
14 years 2 months ago
2003
IEEE
When developing new designs, debugging the prototype is important to resolve application malfunction. During this board design debug, often a few pins of an IC are measured to che...