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DATE
2005
IEEE
97views Hardware» more  DATE 2005»
14 years 2 months ago
Synchronization Processor Synthesis for Latency Insensitive Systems
In this paper we present our contribution in terms of synchronization processor for a SoC design methodology based on the theory of the latency insensitive systems (LIS) of Carlon...
Pierre Bomel, Eric Martin, Emmanuel Boutillon
DATE
2005
IEEE
121views Hardware» more  DATE 2005»
14 years 2 months ago
Joint Power Management of Memory and Disk
This paper presents a scheme to combine memory and power management for achieving better energy reduction. Our method periodically adjusts the size of physical memory and the time...
Le Cai, Yung-Hsiang Lu
DATE
2005
IEEE
96views Hardware» more  DATE 2005»
14 years 2 months ago
Reliable System Specification for Self-Checking Data-Paths
Cristiana Bolchini, Fabio Salice, Donatella Sciuto...
DATE
2005
IEEE
102views Hardware» more  DATE 2005»
14 years 2 months ago
New Schemes for Self-Testing RAM
This paper gives an overview of a new technique, named pseudo-ring testing (PRT). PRT can be applied for testing wide type of random access memories (RAM): bitor word-oriented and...
Ghenadie Bodean, D. Bodean, A. Labunetz
DATE
2005
IEEE
122views Hardware» more  DATE 2005»
14 years 2 months ago
Direct Conversion Pulsed UWB Transceiver Architecture
Ultra-wideband (UWB) communication is an emerging wireless technology that promises high data rates over short distances and precise locationing. The large available bandwidth and...
Raúl Blázquez, Fred S. Lee, David D....
DATE
2005
IEEE
97views Hardware» more  DATE 2005»
14 years 2 months ago
Specification Test Compaction for Analog Circuits and MEMS
Sounil Biswas, Peng Li, R. D. (Shawn) Blanton, Lar...
DATE
2005
IEEE
109views Hardware» more  DATE 2005»
14 years 2 months ago
ISEGEN: Generation of High-Quality Instruction Set Extensions by Iterative Improvement
Customization of processor architectures through Instruction Set Extensions (ISEs) is an effective way to meet the growing performance demands of embedded applications. A high-qua...
Partha Biswas, Sudarshan Banerjee, Nikil D. Dutt, ...
DATE
2005
IEEE
127views Hardware» more  DATE 2005»
14 years 2 months ago
A Novel Low-overhead Delay Testing Technique for Arbitrary Two-Pattern Test Application
— With increasing process fluctuations in nano-scale technology, testing for delay faults is becoming essential in manufacturing test to complement stuck-at-fault testing. Desig...
Swarup Bhunia, Hamid Mahmoodi-Meimand, Arijit Rayc...
DATE
2005
IEEE
100views Hardware» more  DATE 2005»
14 years 2 months ago
DPA on Quasi Delay Insensitive Asynchronous Circuits: Formalization and Improvement
The purpose of this paper is to formally specify a flow devoted to the design of Differential Power Analysis (DPA) resistant QDI asynchronous circuits. The paper first proposes a ...
G. Fraidy Bouesse, Marc Renaudin, Sophie Dumont, F...
DATE
2005
IEEE
125views Hardware» more  DATE 2005»
14 years 2 months ago
Hybrid BIST Based on Repeating Sequences and Cluster Analysis
We present a hybrid BIST approach that extracts the most frequently occurring sequences from deterministic test patterns; these extracted sequences are stored on-chip. We use clus...
Lei Li, Krishnendu Chakrabarty