DATE
2006
IEEE
14 years 3 months ago
2006
IEEE
Generation of n -detection test sets is typically done for a single fault model. In this work we investigate the generation of n -detection test sets by pairing each fault of a ta...
DATE
2006
IEEE
14 years 3 months ago
2006
IEEE
We present an approach to prevent overtesting in scan-based delay test. The test data is transformed with respect to functional constraints while simultaneously keeping as many po...
DATE
2006
IEEE
14 years 3 months ago
2006
IEEE
DATE
2006
IEEE
14 years 3 months ago
2006
IEEE
A significant volume of research has concentrated on operating-system directed power management (OSPM). The primary focus of previous research has been the development of OSPM po...
DATE
2006
IEEE
14 years 3 months ago
2006
IEEE
Enhancing productivity for designing complex embedded systems requires system level design methodology and language support for capturing complex design in high level models. For ...
DATE
2006
IEEE
14 years 3 months ago
2006
IEEE
Memory and communication architectures have a significant impact on the cost, performance, and time-to-market of complex multi-processor system-on-chip (MPSoC) designs. The memory...
DATE
2006
IEEE
14 years 3 months ago
2006
IEEE
In this paper we propose a dynamic code overlay technique of synchronous data-flow (SDF) –modeled program for low-end embedded systems which lack MMUsupport. With this technique...
DATE
2006
IEEE
14 years 3 months ago
2006
IEEE
Customizing the bypasses in an embedded processor uncovers valuable trade-offs between the power, performance and the cost of the processor. Meaningful exploration of bypasses re...
DATE
2006
IEEE
14 years 3 months ago
2006
IEEE
We present a dynamic bit-width adaptation scheme in DCT applications for efficient trade-off between image quality and computation energy. Based on sensitivity differences of 64 ...
DATE
2006
IEEE
14 years 3 months ago
2006
IEEE
The power density inside high performance systems continues to rise with every process technology generation, thereby increasing the operating temperature and creating “hot spot...