Extreme technology integration in the sub-micron regime comes with a rapid rise in heat dissipation and power density for modern processors. Dynamic voltage scaling is a widely us...
Amin Ansari, Shuguang Feng, Shantanu Gupta, Scott ...
With the shrinking of technology feature sizes, the share of leakage in total power consumption of digital systems continues to grow. Traditional dynamic voltage scaling (DVS) fail...
Energy consumption is a critical design issue in real-time systems, especially in battery- operated systems. Maintaining high performance, while extending the battery life between...
SRAM cell design is driven by the need to satisfy static noise margin, write margin and read current margin (RCM) over all cells in the array in an energy-efficient manner. These ...
Ashish Kumar Singh, Ku He, Constantine Caramanis, ...
Energy efficiency is a primary concern for microprocessor designers. A very effective approach to improving the energy efficiency of a chip is to lower its supply voltage to very ...
Timothy N. Miller, Renji Thomas, James Dinan, Bruc...
Modern digital IC designs have a critical operating point, or "wall of slack", that limits voltage scaling. Even with an errortolerance mechanism, scaling voltage below a...
Andrew B. Kahng, Seokhyeong Kang, Rakesh Kumar, Jo...
—Multi-Vdd techniques enable application of lower supply voltage levels on cells with timing slacks. New voltage assignment, placement and voltage island partitioning methods are...
Reduced device dimensions and operating voltages that accompany technology scaling have led to increased design challenges with each successive technology node. Large scale 6T SRA...
Randy W. Mann, Satyanand Nalam, Jiajing Wang, Bent...
: Clock networks account for a significant fraction of the power dissipation of a chip and are critical to performance. This paper presents theory and algorithms for building a low...
There is a growing need to analyze and optimize the stand-by component of power in digital circuits designed for portable and battery-powered applications. Since these circuits re...
David Blaauw, Steven M. Martin, Trevor N. Mudge, K...