In deep submicron VLSI circuits, interconnect reliability due to electromigration and thermal effects is fast becoming a serious design issue particularly for long signal lines. T...
tems. STARS manipulates abstract representations of system components to obtain upper bounds on the number of various events in the system, as well as a bound on the response time....
— The communication sub-system of complex IC systems is increasingly critical for achieving system performance. Given this, it is important that the on-chip communication archite...
In this paper, we present a novel wire duplication-based interconnect modeling technique. The proposed modeling technique exploits the sparsity of the L 1 matrix, where L is the ...
Abstract—Interconnects (wires, buffers, clock distribution networks, multiplexers and busses) consume a significant fraction of total circuit power. In this work, we demonstrat...
Design ECO commonly happens in industry due to constraints or target changes from manufacturing, marketing, reliability, or performance. At each step, designers usually want to mo...
Within the verification community, there has been a recent increase in interest in Quantified Boolean Formula evaluation (QBF) as many interesting sequential circuit verification ...
The challenges for developing an ESD (Electro-static Discharge) layout extractor originate from unconventional layout patterns of ESD protection devices, parasitic ESD device extr...
This work presents several new techniques for enhancing the performance of deterministic test pattern generation for VLSI circuits. The techniques introduced are called dynamic de...
Chen Wang, Sudhakar M. Reddy, Irith Pomeranz, Xiji...