ITC
1998
IEEE
14 years 1 months ago
1998
IEEE
New methodologies based on functional testing and built-in self-test can narrow the gap between necessary solutions and existing techniques for processor validation and testing. W...
ITC
1998
IEEE
14 years 1 months ago
1998
IEEE
ITC
1998
IEEE
14 years 1 months ago
1998
IEEE
Automated fault diagnosis based on the stuckat fault model is not always effective. This paper presents practical experiences in applying a bridging fault based diagnosis techniqu...
ITC
1998
IEEE
14 years 1 months ago
1998
IEEE
ITC
1998
IEEE
14 years 1 months ago
1998
IEEE
This paper explores defects found in a high volume microprocessor when shipping at a low defect level. A brief description of the manufacturing flow along with definition of DPM i...
ITC
1998
IEEE
14 years 1 months ago
1998
IEEE
The main objective of core-based IC design is improvement of design efficiency and time-to-market. In order to prevent test development from becoming the bottleneck in the entire ...
ITC
1998
IEEE
14 years 1 months ago
1998
IEEE
ITC
1998
IEEE
14 years 1 months ago
1998
IEEE
Previously-proposed strategies for VLSI fault diagnosis have su ered from a variety of self-imposed limitations. Some techniques are limited to a speci c fault model, and many wil...
ITC
1998
IEEE
14 years 1 months ago
1998
IEEE
The ability to make in-situ performance measurements of MEMS operating at high speeds has been demonstrated using a new image analysis system. Significant improvements in performa...
ITC
1998
IEEE
14 years 1 months ago
1998
IEEE
