ISLPED
2007
ACM
14 years 10 days ago
2007
ACM
Negative bias temperature instability (NBTI) has become a dominant reliability concern for nanoscale PMOS transistors. In this paper, we propose variable-latency adder (VL-adder) ...
DATE
2010
IEEE
14 years 18 days ago
2010
IEEE
Due to fast technology scaling, negative bias temperature instability (NBTI) has become a major reliability concern in designing modern integrated circuits. In this paper, we prese...
DAC
2004
ACM
14 years 2 months ago
2004
ACM
A processor core, previously implemented in a 0.25m Al process, is redesigned for a 0.13m Cu process to create a dualcore processor with 1MB integrated L2 cache, offering an effic...
DATE
2010
IEEE
14 years 3 months ago
2010
IEEE
—Time-dependent performance degradation due to transistor aging caused by mechanisms such as Negative Bias Temperature Instability (NBTI) and Hot Carrier Injection (HCI) is one o...
DAC
2006
ACM
14 years 4 months ago
2006
ACM
Negative bias temperature instability (NBTI) has become the dominant reliability concern for nanoscale PMOS transistors. In this paper, a predictive model is developed for the deg...
ISQED
2006
IEEE
14 years 4 months ago
2006
IEEE
— Negative Bias Temperature Instability (NBTI) has the potential to become one of the main show-stoppers of circuit reliability in nanometer scale devices due to its deleterious ...
ISQED
2008
IEEE
14 years 5 months ago
2008
IEEE
Negative bias temperature instability (NBTI) is one of the primary limiters of reliability lifetime in nano-scale integrated circuits. NBTI manifests itself in a gradual increase ...
GLVLSI
2008
IEEE
14 years 5 months ago
2008
IEEE
With the scaling down of the CMOS technologies, Negative Bias Temperature Instability (NBTI) has become a major concern due to its impact on PMOS transistor aging process and the ...
ASPDAC
2009
ACM
14 years 5 months ago
2009
ACM
— Negative Bias Temperature Instability (NBTI) in PMOS transistors has become a major reliability concern in present-day digital circuit design. Further, with the recent usage of...
ASPDAC
2009
ACM
14 years 5 months ago
2009
ACM
— Negative Bias Temperature Instability (NBTI) is a leading reliability concern for integrated circuits (ICs). It gradually increases the threshold voltages of PMOS transistors, ...